Surface Roughness Measurement Device 'MFT'
The fine surface roughness of the sample can be measured! It offers excellent cost performance.
The "MFT (MicroFinish Topographer)" is a surface roughness measurement device for samples ranging from small to large diameters, offering simplicity and excellent cost performance. The high-precision phase measurement interferometer is controlled and driven by Apre's REVEAL software, providing various analytical environments with intuitive and easy operation. 【Features】 ■ Simple measurement of large optical parts ■ Quick measurement of small diameter parts ■ Rapid feedback on finishing information ■ Fast non-contact roughness measurement ■ Easy direct measurement of large diameter targets *For more details, please download the PDF or feel free to contact us.
- Company：ジーフロイデ
- Price：Other
